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SEM Transmission Detection

FeliS

3D Electron Diffraction and 4D-STEM — on Your SEM.

The FeliS is a hybrid pixel detector that mounts inside your SEM chamber and enables transmission electron diffraction experiments — solving crystal structures from nanoparticles as small as 100 nm and mapping grain orientations at nanometer resolution — without sacrificing any standard SEM capability.

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FeliS product image
Replace with hosted URL from EngageBay assets
(readout_and_sensor.jpg or installed-in-SEM photo)
512 × 512
Pixel Matrix
55 µm
Pixel Pitch
~10k fps
Max. Frame Rate
2 nanoseconds
Dwell Time (ToA)

Key Capabilities for SEM Transmission Experiments

Built on the Medipix3 and Timepix3 ASIC from the CERN Medipix collaboration — the same detector platform used at leading electron microscopy centres worldwide.

Zero-Noise Single-Electron Counting

The FeliS counts individual electrons with a discriminator threshold set below the single-electron signal. There is no readout noise: every electron above threshold is registered; everything below is discarded. Weak diffraction reflections that would be buried in noise on a CCD or MAPS camera are detected reliably, improving dataset completeness and structure determination accuracy.

Slider Design — No Compromise on On Dual Beam Instruments Use

A motorised retractable lid moves over the sensor when you are not running transmission experiments. Switching takes under 30 seconds without venting the chamber. EDS, BSE imaging, EBSD, and FIB operations are completely unaffected. One instrument, all your methods.

Open Data Ecosystem

Raw data exports directly in formats compatible with PETS2 and Instamatic for 3D-ED structure solution, and with py4DSTEM and LiberTEM for 4D-STEM analysis. No proprietary processing lock-in — your data works with the software your community already uses.

Ready to extend your SEM?

Download the full technical whitepaper to understand the method, the hardware, and which samples are a good fit. Or contact us to discuss compatibility with your SEM model and arrange a demonstration measurement on your own samples.